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Verification and debug of today's high speed, low voltage DDR Memory interface signals requires probing solutions that can accurately acquire from a wide variety of form factors and provide excellent signal fidelity. Tektronix logic analyzer probes contain a variety of connectivity options that are engineered to ensure that signal acquisition is a true reflection of your design's performance.
P6960HS泰克邏輯分析儀探頭Key features
- <0.7 pF total capacitive loading minimizes intrusion on circuits
- 20 k? input resistance
- 6.5 Vp-p dynamic range supports a broad range of logic families
- General-purpose probing allows flexible attachment to industry- standard connections
- Connectorless probing system eliminates need for onboard connectors
Applications
- DDR3/DDR4 Debug and Verification
- LPDDR Debug and Validation
- Embedded Systems integration, debug, and verification
Leading probe solutions for real-time digital systems analysis
P6960HS泰克邏輯分析儀探頭
The DDR memory interface has evolved to support higher data rates at lower voltages creating several debug and validation challenges. With the industry's lowest capacitance, the P6900 specialty probes for DDR Memory applications offer excellent signal integrity to ensure a true representation of the signal - critical for connecting to high-speed memory interfaces and performing debug and analysis.
Probes with a variety of attachment mechanisms for different applications are available. Where circuit board space is at a premium, the high-density P6960DBL and P6962DBL probes with D-Max® Probing Technology offers the industry's smallest available footprint. For use with interposers, the P6960HCD, P6960HCD-LV and P6962HCD offer a low profile connection mechanism making it mechanically easy to use with the interposers. For low signal swing application the P6960HS based on the D-Max® Probing Technology is suitable.
For debugging the signal integrity problems common on high-speed DDR buses, the P6900 specialty probes for DDR applications work with the TLA7Bxx modules to provide iCapture™ simultaneous digital-analog acquisition. This allows you to clearly see the time-correlated digital and analog behavior of your design, without the extra capacitance and setup time of double probing.